Soft X-rays enable fast and reliable graphene measurements

Researchers from Rome, Italy, developed a new method for graphene identification. The researchers use diamond-like C KVV spectrum excited by soft X-rays.

This new method provides fast and nondestructive graphene measurement. The researchers say it is a very reliable method that even works for composite materials that contain graphene flakes.

Posted: Feb 11,2014 by Ron Mertens