An international collaboration aims to strengthen graphene quality standards
Researchers at The University of Manchester, working with the UK’s National Physical Laboratory (NPL) and 15 international partners, have developed a new protocol, using transmission electron microscopy (TEM), which is meant to underpin a new ISO technical specification for graphene.
The results of the large interlaboratory selected area electron diffraction (SAED) comparison study, where the collaborating laboratories measured and analyzed nominally identical samples of chemical vapor deposited (CVD) graphene, were recently presented. Large variations were observed in the measured ratios of diffraction spot intensities, with the largest variance associated with poor quality SAED data resulting from poor specimen handling and storage. To inform the reliable determination of monolayer thickness from SAED patterns, the team provided a description of best practice for specimen handling, TEM operation, data collection and analysis. The results of this work have been directly incorporated into ISO/TS 21356-2 for the characterization of graphene sheets.

